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Authors: Tobias Lamprecht, Felix Betschon, Joris Lambrecht, Hannes Ramon, Xin Yin, Alex Bruderer, Romeo Premerlani
Journal title: 2018 IEEE 68th Electronic Components and Technology Conference (ECTC)
Journal publisher: IEEE
Published year: 2018
Published pages: 854-858
DOI identifier: 10.1109/ectc.2018.00132
ISBN: 978-1-5386-4999-2