Universal test system for system embedded optical interconnect

Summary

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Authors: Richard C. Pitwon, Marika Immonen, Henning Schroeder, Marcel Neitz, Kai Wang

Journal title: Optical Interconnects XVIII

Journal publisher: SPIE

Published year: 2018

Published pages: 3

DOI identifier: 10.1117/12.2289590

ISBN: 9781-510615625