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Authors: Jörn P. Epping, Arne Leinse, Ruud M. Oldenbeuving, Ilka Visscher, Douwe Geuzebroek, Dimitri Geskus, Albert van Rees, Klaus J. Boller, Michael Theurer, Martin Möhrle, Martin Schell, Chris G. H. Roeloffzen, René G. Heideman
Journal title: SPIE Proceedings
Journal number: Proceedings Volume 11274, Physics and Simulation of Optoelectronic Devices XXVIII; 112741L
Journal publisher: SPIE
Published year: 2020
DOI identifier: 10.1117/12.2552264
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