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Authors: Albert van Rees, Youwen Fan, Jesse Mak, Rob E. M. Lammerink, Cornelis A. A. Franken, Ruud M. Oldenbeuving, Dimitri Geskus, Jörn P. Epping, Marcel Hoekman, Ronald Dekker, Edwin J. Klein, Douwe H. Geuzebroek, Chris G. H. Roeloffzen, Carsten Fallnich, Peter J. M. van der Slot, Klaus-Jochen Boller
Journal title: SPIE Proceedings
Journal number: Volume 11692, Optical Interconnects XXI; 1169209
Journal publisher: SPIE
Published year: 2021
DOI identifier: 10.1117/12.2583821