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Authors: Chenhui Li, Ripalta Stabile, Finn Kraemer, Teng Li, Oded Raz
Journal title: 2018 IEEE 68th Electronic Components and Technology Conference (ECTC)
Journal publisher: IEEE
Published year: 2018
Published pages: 848-853
DOI identifier: 10.1109/ectc.2018.00131
ISBN: 978-1-5386-4999-2