Automated test platform at EFFECT Photonics: key enabler for PDK development

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Authors: Huang, Xiaoheng; Tahvili, Saeed; Kleijn, Emil; Docter, Boudewijn

Journal number: 2

Journal publisher: IEEE Photonics society Benelux Chapter

Published year: 2018

DOI identifier: 10.5281/zenodo.3237727