Reliable 50Gb/s silicon photonics platform for next-generation data center optical interconnects

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Authors: P. Absil, K. Croes, A. Lesniewska, P. De Heyn, Y. Ban, B. Snyder, J. De Coster, F. Fodor, V. Simons, S. Balakrishnan, G. Lepage, N. Golshani, S. Lardenois, S. A. Srinivasan, H. Chen, W. Vanherle, R. Loo, R. Boufadil, M. Detalle, A. Miller, P. Verheyen, M. Pantouvaki, J. Van Campenhout

Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2017

Published pages: 34.2.1-34.2.4

DOI identifier: 10.1109/iedm.2017.8268494

ISBN: 978-1-5386-3559-9