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Authors: Y. Ban, J. Verbist, M. Vanhoecke, J. Bauwelinck, P. Verheyen, S. Lardenois, M. Pantouvaki, J. Van Campenhout
Journal title: 2019 IEEE Optical Interconnects Conference (OI)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-2
DOI identifier: 10.1109/oic.2019.8714384
ISBN: 978-1-7281-1496-5