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Authors: G. Azzellino, A. Ragni, M. Carminati, G. Ferrari
Journal title: 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-6
DOI identifier: 10.1109/I2MTC.2018.8409842
ISBN: 978-1-5386-2222-3