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Authors: X. Yin, M. Verplaetse, L. Breyne, J. Van Kerrebrouck, T. De Keulenaer, A. Vyncke, R. Pierco, R. Vaernewyck, S. Spiga, M.-C. Amann, J. Chen, G. Van Steenberge, G. Torfs, J. Bauwelinck
Journal title: 2017 IEEE Optical Interconnects Conference (OI)
Journal publisher: IEEE
Published year: 2017
Published pages: 33-34
DOI identifier: 10.1109/OIC.2017.7965517
ISBN: 978-1-5090-5016-1