Structural characterization of off-stoichiometric kesterite-type Cu 2 ZnGeSe 4 compound semiconductors: from cation distribution to intrinsic point defect density

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Authors: R. Gunder, J. A. Márquez-Prieto, G. Gurieva, T. Unold, S. Schorr

Journal title: CrystEngComm

Journal number: 20/11

Journal publisher: Royal Society of Chemistry

Published year: 2018

Published pages: 1491-1498

DOI identifier: 10.1039/C7CE02090B

ISSN: 1466-8033