The effect of Cu-Zn disorder on charge carrier mobility and lifetime in Cu2ZnSnSe4

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Authors: Hannes Hempel, Rainer Eichberger, Ingrid Repins, Thomas Unold

Journal title: Thin Solid Films

Journal number: 666

Journal publisher: Elsevier Sequoia

Published year: 2018

Published pages: 40-43

DOI identifier: 10.1016/j.tsf.2018.09.027

ISSN: 0040-6090