Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials

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Authors: Charles J. Hages, Alex Redinger, Sergiu Levcenko, Hannes Hempel, Mark J. Koeper, Rakesh Agrawal, Dieter Greiner, Christian A. Kaufmann, Thomas Unold

Journal title: Advanced Energy Materials

Journal publisher: Wiley-VCH Verlag

Published year: 2017

Published pages: 1700167

DOI identifier: 10.1002/aenm.201700167

ISSN: 1614-6832