DEIS: Dependability Engineering Innova-tion for industrial CPS

Summary

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Authors: E. Armengaud, G. Macher, A. Massoner, S. Frager, R. Adler, D. Schneider, S. Longo, M. Melis, R. Groppo, F. Villa, P. O’Leary, K. Bambury, A. Finnegan, M. Zeller, K. Höfig, Y. Papadopoulos, R. Hawkins, T. Kelly

Journal title: 21th International Forum on Advanced Microsystems for Automotive Applications (AMAA 2017)

Journal publisher: Springer

Published year: 2017

ISBN: 978-3-319-66972-4