Atomistic- to Circuit-Level Modeling of Doped SWCNT for On-Chip Interconnects

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Authors: Jie Liang, Jaehyun Lee, Salim Berrada, Vihar P. Georgiev, Reeturaj Pandey, Rongmei Chen, Asen Asenov, Aida Todri-Sanial

Journal title: IEEE Transactions on Nanotechnology

Journal number: 17/6

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 1084-1088

DOI identifier: 10.1109/TNANO.2018.2802320

ISSN: 1536-125X