Atomistic to circuit level modeling of defective doped SWCNTs with contacts for on-chip interconnect application

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Authors: J. Liang, J. Lee, S. Berrada, V. Georgiev, A. Asenov, N. Azemard-Crestani, A. Todri-Sanial

Journal title: 2017 IEEE 12th Nanotechnology Materials and Devices Conference (NMDC)

Journal publisher: IEEE

Published year: 2017

Published pages: 66-67

DOI identifier: 10.1109/NMDC.2017.8350506

ISBN: 978-1-5386-2772-3