Nanoscale Scanning Probe Thermometry

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Fabian Konemann, Morten Vollmann, Fabian Menges, I-Ju Chen, Norizzawati Mohd Ghazali, Tomohiro Yamaguchi, Koji Ishibashi, Claes Thelander, Bernd Gotsmann

Journal title: 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-6

DOI identifier: 10.1109/therminic.2018.8593312

ISBN: 978-1-5386-6759-0