Local thermometry of self-heated nanoscale devices

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Authors: F. Menges, F. Motzfeld, H. Schmid, P. Mensch, M. Dittberner, S. Karg, H. Riel, B. Gotsmann

Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2016

Published pages: 15.8.1-15.8.4

DOI identifier: 10.1109/IEDM.2016.7838427

ISBN: 978-1-5090-3902-9