Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks

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Authors: Michael Maiwald, Patrick Gräßer, Lukas Wander, Svetlana Guhl, Klas Meyer, Simon Kern

Journal title: Invited Talk at Swiss Chemical Society Fall Meeting, Symposium on PAT & Industry 4.0, University of Bern, Bern/CH, 21.–22.08.2017

Journal publisher: Bundesanstalt für Materialforschung und -prüfung (BAM)

Published year: 2017