Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy

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Authors: Filippo Giannazzo, Giuseppe Greco, Salvatore Di Franco, Patrick Fiorenza, Ioannis Deretzis, Antonino La Magna, Corrado Bongiorno, Massimo Zimbone, Francesco La Via, Marcin Zielinski, Fabrizio Roccaforte

Journal title: Advanced Electronic Materials

Journal publisher: Wiley

Published year: 2020

Published pages: 1901171

DOI identifier: 10.1002/aelm.201901171

ISSN: 2199-160X