Annealing-Induced Changes in the Nature of Point Defects in Sublimation-Grown Cubic Silicon Carbide

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Authors: Michael Schöler, Clemens Brecht, Peter J. Wellmann

Journal title: Materials

Journal number: 12/15

Journal publisher: MDPI Open Access Publishing

Published year: 2019

Published pages: 2487

DOI identifier: 10.3390/ma12152487

ISSN: 1996-1944