Influence of Quantum Dot Characteristics on the Performance of Hybrid SET-FET Circuits

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Authors: E. Amat, F. Klupfel, J. Bausells, F. Perez-Murano

Journal title: IEEE Transactions on Electron Devices

Journal number: 66/10

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 4461-4467

DOI identifier: 10.1109/ted.2019.2937141

ISSN: 0018-9383