Quantum dot location relevance into SET-FET circuits based on FinFET devices

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Authors: Amat, Esteve; Moral, Alberto del; Bausells, Joan; Perez-Murano, Francesc; Klüpfel, Fabian

Journal title: Proc. Conference on Design of Circuits and Integrated Systems (DCIS)

Journal number: IEEE Xplore, April 2019

Journal publisher: IEEE

Published year: 2019

DOI identifier: 10.1109/dcis.2018.8681478