Exploring the Influence of Variability on Single-Electron Transistors Into SET-Based Circuits

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Esteve Amat, Joan Bausells, Francesc Perez-Murano

Journal title: IEEE Transactions on Electron Devices

Journal number: 64/12

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 5172-5180

DOI identifier: 10.1109/ted.2017.2765003

ISSN: 0018-9383