Review on suitable eDRAM configurations for next nano-metric electronics era

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Authors: E. AMAT, R. CANAL, A. CALOMARDE, A. RUBIO

Journal title: International Journal of the Society of Materials Engineering for Resources

Journal number: 23/1

Journal publisher: Society of Materials Engineering for Resources for Japan

Published year: 2018

Published pages: 22-29

DOI identifier: 10.5188/ijsmer.23.22

ISSN: 1347-9725