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Authors: Ran Yu, Ujwal Gadiraju, Besnik Fetahu, Stefan Dietze
Journal title: 2017 IEEE 33rd International Conference on Data Engineering (ICDE)
Journal publisher: IEEE
Published year: 2017
Published pages: 179-182
DOI identifier: 10.1109/icde.2017.69
ISBN: 978-1-5090-6543-1
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