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Authors: Tongyun Li, Haymen Shams, Cyril C. Renaud, Alwyn J. Seeds, Richard Penty, Martyn Fice, Ian White
Journal title: 2018 International Topical Meeting on Microwave Photonics (MWP)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-4
DOI identifier: 10.1109/mwp.2018.8552908
ISBN: 978-1-5386-5226-8