DeepIaC: deep learning-based linguistic anti-pattern detection in IaC

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Authors: Nemania Borovits, Indika Kumara, Parvathy Krishnan, Stefano Dalla Palma, Dario Di Nucci, Fabio Palomba, Damian A. Tamburri, Willem-Jan van den Heuvel

Journal title: Proceedings of the 4th ACM SIGSOFT International Workshop on Machine-Learning Techniques for Software-Quality Evaluation

Journal publisher: ACM

Published year: 2020

Published pages: 7-12

DOI identifier: 10.1145/3416505.3423564

ISBN: 9781450381246