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Authors: Thomas Durieux, Youssef Hamadi, Zhongxing Yu, Benoit Baudry, Martin Monperrus
Journal title: 2018 IEEE 11th International Conference on Software Testing, Verification and Validation (ICST)
Journal publisher: IEEE
Published year: 2018
Published pages: 139-149
DOI identifier: 10.1109/icst.2018.00023
ISBN: 978-1-5386-5012-7