Summary
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Authors: Maria Kechagia, Xavier Devroey, Annibale Panichella, Georgios Gousios, Arie van Deursen
Journal title: Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis - ISSTA 2019
Journal publisher: ACM Press
Published year: 2019
Published pages: 192-203
DOI identifier: 10.1145/3293882.3330552
ISBN: 9781-450362245
