A Test-Suite Diagnosability Metric for Spectrum-Based Fault Localization Approaches

Summary

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Authors: Alexandre Perez, Rui Abreu, Arie van Deursen

Journal title: 2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE)

Journal publisher: IEEE

Published year: 2017

Published pages: 654-664

DOI identifier: 10.1109/icse.2017.66

ISBN: 978-1-5386-3868-2