Summary
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Authors: Yu Yu, Kenneth Alberto Funes Mora, Jean-Marc Odobez
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 40/11
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 2653-2667
DOI identifier: 10.1109/TPAMI.2018.2841403
ISSN: 0162-8828
