CV Stretch-Out Correction after Bias Temperature Stress: Work-Function Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast States

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Authors: T. Grasser, B. O'Sullivan, B. Kaczer, J. Franco, B. Stampfer, M. Waltl

Journal title: 2021 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-6

DOI identifier: 10.1109/irps46558.2021.9405184

ISBN: 978-1-7281-6893-7