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Authors: Armando Miraglia, Dirk Vogt, Herbert Bos, Andy Tanenbaum, Cristiano Giuffrida
Journal title: 2016 IEEE 27th International Symposium on Software Reliability Engineering (ISSRE)
Journal publisher: IEEE
Published year: 2016
Published pages: 455-466
DOI identifier: 10.1109/ISSRE.2016.9
ISBN: 978-1-4673-9002-6