A Horizontal Patent Test Collection

Summary

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Authors: Mihai Lupu, Alexandros Bampoulidis, Luca Papariello

Journal title: Proceedings of the 42nd International ACM SIGIR Conference on Research and Development in Information Retrieval

Journal publisher: ACM

Published year: 2019

Published pages: 1213-1216

DOI identifier: 10.1145/3331184.3331346

ISBN: 9781450361729