Fault Analysis Assisted by Simulation

Summary

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Authors: Kais Chibani, Adrien Facon, Sylvain Guilley, Damien Marion, Yves Mathieu, Laurent Sauvage, Youssef Souissi, Sofiane Takarabt

Journal title: Automated Methods in Cryptographic Fault Analysis

Journal publisher: Springer International Publishing

Published year: 2019

Published pages: 263-277

DOI identifier: 10.1007/978-3-030-11333-9_12

ISBN: 978-3-030-11332-2