Detecting faults in inner product masking scheme

Summary

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Authors: Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley

Journal title: Journal of Cryptographic Engineering

Journal publisher: Springer Science + Business Media

Published year: 2020

DOI identifier: 10.1007/s13389-020-00227-6

ISSN: 2190-8508