Intrinsic Resiliency of S-Boxes Against Side-Channel Attacks–Best and Worst Scenarios

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Authors: Claude Carlet, Eloi de Cherisey, Sylvain Guilley, Selcuk Kavut, Deng Tang

Journal title: IEEE Transactions on Information Forensics and Security

Journal number: 16

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 203-218

DOI identifier: 10.1109/tifs.2020.3006399

ISSN: 1556-6013