Summary
This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.
Authors: Muravyeva, E., Janssen, J., Dirkx, K., & Specht, M.
Journal title: Proceedings of the 21st International Conference on Techology Enhanced Assessment
Journal publisher: Springer
Published year: 2019