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Authors: M. Pini, A. Minetto, A. Vesco, D. Berbecaru, L.M. Contreras Murillo, P. Nemry, I. De Francesca, B. Rat, K. Callewaert
Journal title: 2021 IEEE International Workshop on Metrology for AeroSpace
Journal publisher: IEEE MetroAeroSpace
Published year: 2021