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Authors: P. Tavella, I. Sesia, G. Cerretto, G. Signorile, D. Calonico, R. Costa, C. Clivati, E. Cantoni, C. De Stefano, M. Frittelli, V. Formichella, A. Cernigliaro, F. Fiasca, A. Perucca, S. Mantero, P. Cerabolini, L. Rotiroti, E. Biserni, V. Leone, E. Zarroli, D. Sormani, V. Dhiri, P. Defraigne, N. Ozdemir, Q. Baire, M.T. Veiga, T. Suarez, J. Diaz, M. Gandara, V. Hamoniaux, M. Mangiantini, E. Varriale, Q
Journal title: 2016 IEEE Metrology for Aerospace (MetroAeroSpace)
Journal publisher: IEEE
Published year: 2016
Published pages: 585-590
DOI identifier: 10.1109/MetroAeroSpace.2016.7573281
ISBN: 978-1-4673-8292-2
- Not specified