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Authors: P. Tavella, I. Sesia, G. Cerretto, G. Signorile, D. Calonico, E. Cantoni, C. De Stefano, V. Formichella, R. Costa, P. Cerabolini, L. Rotiroti, A. Simonetti, A. Colombo, P. Defraigne, N Ozdemir, M. Gandara, P. L. Puech, V. Hamoniaux, E. Varriale, Q. Morante, T. Widomski, J. Kaczmarek, J. Uzycki, K. Borgulski, P. Olbrysz, J. Kowalski, A. Cernigliaro, F. Fiasca, A. Perucca, A. Samperi, V. Dhiri, E. G
Journal title: 2015 IEEE Metrology for Aerospace (MetroAeroSpace)
Journal publisher: IEEE
Published year: 2015
Published pages: 98-102
DOI identifier: 10.1109/MetroAeroSpace.2015.7180634
ISBN: 978-1-4799-7569-3
- Not specified