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Authors: Luca Abeni, Daniele Fontanelli, Luigi Palopoli, Bernardo Villalba Frias
Journal title: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-6
DOI identifier: 10.1109/I2MTC.2017.7969878
ISBN: 978-1-5090-3596-0