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Authors: Yan Yan, Elisa Ricci, Ramanathan Subramanian, Gaowen Liu, Oswald Lanz, Nicu Sebe
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 38/6
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2016
Published pages: 1070-1083
DOI identifier: 10.1109/TPAMI.2015.2477843
ISSN: 0162-8828