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Authors: Daniele Fontanelli, David Macii, Payam Nazemzadeh, Luigi Palopoli
Journal title: 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings
Journal publisher: IEEE
Published year: 2016
Published pages: 1-6
DOI identifier: 10.1109/I2MTC.2016.7520443
ISBN: 978-1-4673-9220-4