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Authors: Zhihao Shen, Hosun Lee, Sungmoon Jeong, Nak Young Chong
Journal title: 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE)
Journal publisher: IEEE
Published year: 2017
Published pages: 1169-1172
DOI identifier: 10.23919/SICE.2017.8105625
ISBN: 978-4-907764-57-9
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