Skin Admittance Measurement for Emotion Recognition: A Study over Frequency Sweep

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Authors: Alberto Greco, Antonio Lanata, Luca Citi, Nicola Vanello, Gaetano Valenza, Enzo Scilingo

Journal title: Electronics

Journal number: 5/3

Journal publisher: MDPI

Published year: 2016

Published pages: 46

DOI identifier: 10.3390/electronics5030046

ISSN: 2079-9292