An experimental approach to the health-monitoring of a silicon carbide MOSFET-based power module

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Authors: Malorie Hologne, Pascal Bevilacqua, Bruno Allard, Guy Clerc, Hervé Morel, Hubert Razik, Antoine Barrière, Vinaykumar Karode, Navien Devadass

Journal title: Proc. of the IEEE International Electric Machines and Drives Conference

Journal number: 2017

Journal publisher: IEEE

Published year: 2017

ISBN: 978-1-5090-4281-4