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Authors: J. Andrea, M. Buffo, E. Guillard, R. Landfried, R. Boukadoum, Ph. Teste
Journal title: 2017 IEEE Holm Conference on Electrical Contacts
Journal publisher: IEEE
Published year: 2017
Published pages: 317-324
DOI identifier: 10.1109/HOLM.2017.8088106
ISBN: 978-1-5386-1091-6
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