An approach of decision support system for drift diagnosis in cyber-physical production systems

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Authors: A. Arama, E. Villeneuve, C. Merlo and L. L. Salvado

Journal title: 2022 IEEE International Systems Conference (SysCon)

Journal publisher: IEEE

Published year: 2022

Published pages: 1-7

DOI identifier: 10.1109/syscon53536.2022.9773914

ISBN: 978-1-6654-3992-3